HED-G5000 (Full Automatic ESD Tester)
- Adaptable to the following international standard waveform; JEDEC, ESDA, AEC, and JEITA
- This system’s uniquely short discharge circuit is made possible by its original mechanical design.
- The short circuit minimizes the influence of inductance and capacitance on the data.
- The use of a single circuit ensures data stability for each device pin tested.
HED-S5000R-D (Full Automatic ESD Tester)
- Realization of single discharge circuit Use the same discharging circuit for each test pins. These are useful to stability for discharging waveform and reducing of trouble.
- Adaptable to various standard waveforms This is high equipment that corresponds with Japan and aboard standard.(JEITA/ESDA/JEDEC)
- Adaptable to Latch-up test Corresponds with ESD Latch-up, contact current Latch-up and Vsupply overvvoltage Latch-up test
HED-S5000R
- Connecting with curve tracer, this tester is possible to make a destruction judgment.
- In the feature, up grading as auto test system can be possible.
- Select the test pin number and test application from following model.
HED-N5000-DCPC
- Simultaneous plural zapping is practicable Install maximum of 8 sockets and simultaneous plural zapping into each socket is possible
- Adaptable to various standard waveform This corresponds with domestic and aboard standard such as JEITA, JEDEC and ESDA standard.
- Adaptable to Latch-up test Adaptable to ESD pulse method, Vsupply overvoltage method and constant pulse current method.
- Establishing the diversity of destruction judgment Allows the destruction judgment with DC measurement and providing the function test bu using as option.
Compact ESD Tester
- Stand-alone ESD test system
- The Hanwa Compact ESD Tester has been designed for portability,
- improved use of space and high cost performance.
- Perform HBM, MM and leakage measurement without a PC or curve tracer.
